• DocumentCode
    3316352
  • Title

    Fabrication of 64 M DRAM with i-line phase-shift lithography

  • Author

    Nakagawa, K. ; Taguchi, M. ; Ema, T.

  • Author_Institution
    Fujitsu Ltd., Kawasaki, Japan
  • fYear
    1990
  • fDate
    9-12 Dec. 1990
  • Firstpage
    817
  • Lastpage
    820
  • Abstract
    New phase-shift lithography applicable to all device patterns has been developed which combines pattern formation with the shifter alone and edge contrast enhancement with the shifter. Using it one can make 0.3 mu m patterns with i-line photolithography. A 64 M DRAM having memory cells unrestricted by angular considerations was designed for use with this lithography, and experimental 64 M DRAM chips were fabricated. The technique eliminates the need for special pattern design such as assistant patterns. Since it requires only the original design pattern, it is easy to apply to fabrication.<>
  • Keywords
    CMOS integrated circuits; DRAM chips; integrated circuit technology; photolithography; 0.3 micron; 64 Mbit; CMOS; DRAM; edge contrast enhancement; i-line phase-shift lithography; i-line photolithography; memory cells; pattern formation; Fabrication; Lithography; Pattern formation; Random access memory;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices Meeting, 1990. IEDM '90. Technical Digest., International
  • Conference_Location
    San Francisco, CA, USA
  • ISSN
    0163-1918
  • Type

    conf

  • DOI
    10.1109/IEDM.1990.237037
  • Filename
    237037