DocumentCode
3316352
Title
Fabrication of 64 M DRAM with i-line phase-shift lithography
Author
Nakagawa, K. ; Taguchi, M. ; Ema, T.
Author_Institution
Fujitsu Ltd., Kawasaki, Japan
fYear
1990
fDate
9-12 Dec. 1990
Firstpage
817
Lastpage
820
Abstract
New phase-shift lithography applicable to all device patterns has been developed which combines pattern formation with the shifter alone and edge contrast enhancement with the shifter. Using it one can make 0.3 mu m patterns with i-line photolithography. A 64 M DRAM having memory cells unrestricted by angular considerations was designed for use with this lithography, and experimental 64 M DRAM chips were fabricated. The technique eliminates the need for special pattern design such as assistant patterns. Since it requires only the original design pattern, it is easy to apply to fabrication.<>
Keywords
CMOS integrated circuits; DRAM chips; integrated circuit technology; photolithography; 0.3 micron; 64 Mbit; CMOS; DRAM; edge contrast enhancement; i-line phase-shift lithography; i-line photolithography; memory cells; pattern formation; Fabrication; Lithography; Pattern formation; Random access memory;
fLanguage
English
Publisher
ieee
Conference_Titel
Electron Devices Meeting, 1990. IEDM '90. Technical Digest., International
Conference_Location
San Francisco, CA, USA
ISSN
0163-1918
Type
conf
DOI
10.1109/IEDM.1990.237037
Filename
237037
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