DocumentCode
3317285
Title
Bilevel programming for analysis of low-complexity control of linear systems with constraints
Author
Manum, Henrik ; Jones, Colin N. ; Löfberg, Johan ; Morari, Manfred ; Skogestad, Sigurd
Author_Institution
Dept. of Chem. Eng., Norwegian Univ. of Sci. & Technol., Trondheim, Norway
fYear
2009
fDate
15-18 Dec. 2009
Firstpage
946
Lastpage
951
Abstract
In this paper we use bilevel programming to find the maximum difference between a reference controller and a low-complexity controller in terms of the infinity-norm difference of their control laws. A nominal MPC for linear systems with constraints, and a robust MPC for linear systems with bounded additive noise are considered as reference controllers. For possible low-complexity controllers we discuss partial enumeration (PE), Voronoi/closest point, triangulation, linear controller with saturation, and others. A small difference in the norm between a low-complexity controller and a robust MPC may be used to guarantee closed-loop stability of the low-complexity controller and indicate that the behaviour or performance of the low-complexity controller will be similar to that of the reference one. We further discuss how bilevel programming may be used for closed-loop analysis of model reduction.
Keywords
closed loop systems; linear systems; predictive control; robust control; Voronoi/closest point; bilevel programming; bounded additive noise; closed loop analysis; closed loop stability; control laws; infinity norm; linear controller; low complexity controller; model predictive control; model reduction; partial enumeration; reference controller; robust MPC; triangulation; Additive noise; Control system analysis; Control systems; H infinity control; Linear programming; Linear systems; Noise robustness; Reduced order systems; Robust control; Robust stability; bilevel programming; closed-loop analysis; optimal control;
fLanguage
English
Publisher
ieee
Conference_Titel
Decision and Control, 2009 held jointly with the 2009 28th Chinese Control Conference. CDC/CCC 2009. Proceedings of the 48th IEEE Conference on
Conference_Location
Shanghai
ISSN
0191-2216
Print_ISBN
978-1-4244-3871-6
Electronic_ISBN
0191-2216
Type
conf
DOI
10.1109/CDC.2009.5400868
Filename
5400868
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