• DocumentCode
    3317488
  • Title

    Transverse optical mode analysis of long-wavelength VCSELs for high single-mode power operation

  • Author

    Bäcker, Alexandra ; Odermatt, Stefan ; Santschi, Rafael ; Römer, Friedhard ; Witzigmann, Bernd ; Royo, Paul ; Iakovlev, Vladimir ; Caliman, Andrei ; Mereuta, Alexandru ; Syrbu, Alexei ; Kapon, Eli

  • Author_Institution
    Integrated Syst. Lab., ETH Zurich, Zurich
  • fYear
    2008
  • fDate
    1-4 Sept. 2008
  • Firstpage
    87
  • Lastpage
    88
  • Abstract
    We present a detailed numerical study of transverse mode selection of vertical-cavity surface-emitting lasers (VCSELs), based on microscopic models of charge carrier and temperature distributions solved self-consistently together with the optical modes. The simulations describe several measured device characteristics of tunnel junction double-fused VCSELs, in particular the switching between the fundamental and the excited transverse modes. As a conclusion, the onset of the multi-mode regime is shown to result from a combination of thermal lensing and gain-guiding mechanisms as well as spatial hole burning.
  • Keywords
    laser modes; surface emitting lasers; temperature distribution; charge carrier; gain-guiding mechanisms; high single-mode power operation; laser simulation; long-wavelength VCSEL; microscopic models; multimode regime; spatial hole burning; temperature distributions; thermal lensing; transverse mode selection; transverse optical mode analysis; tunnel junction double-fused VCSEL; vertical-cavity surface-emitting lasers; Absorption; Charge carrier processes; Electron optics; Laser modes; Optical microscopy; Optical refraction; Optical sensors; Optical variables control; Surface emitting lasers; Vertical cavity surface emitting lasers; Kramers-Kronig; far-field; higher-order mode; laser simulation; vertical-cavity surface-emitting laser (VCSEL);
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Numerical Simulation of Optoelectronic Devices, 2008. NUSOD '08. International Conference on
  • Conference_Location
    Nottingham
  • Print_ISBN
    978-1-4244-2307-1
  • Type

    conf

  • DOI
    10.1109/NUSOD.2008.4668255
  • Filename
    4668255