An efficient algorithm for fault analysis on the basis of artificial intelligence

Author

Prasad, Vinod B.

Author_Institution

Dept. of Electr. & Comput. Eng. Technol., Bradley Univ., Peoria, IL, USA

fYear

1989

fDate

9-12 Apr 1989

Firstpage

411

Abstract

The author studies the concept of artificial intelligence and applies it to the problem of fault diagnosis for a system which is composed of n independent processors where each processor tests a subset of other processors as given by F.P. Preparata, G. Metze, and R.T. Chien. It is assumed that at most t of these processors are permanently faulty and that the outcome of a test is reliable if and only if the processor which performed the test is fault-free. Using the concept of induction and the method of AND/OR graphing, it is possible that a maximum of 2^t axioms is needed to identify the faulty and nonfaulty sets of processors

Keywords

artificial intelligence; circuit analysis computing; fault location; logic testing; AND/OR graphing; artificial intelligence; axioms; efficient algorithm; fault analysis; faulty sets; independent processors; induction; nonfaulty sets; Algorithm design and analysis; Artificial intelligence; Circuit faults; Computer architecture; Fault diagnosis; Logic testing; Mathematics; Performance evaluation; Power system modeling; System testing;

fLanguage

English

Publisher

ieee

Conference_Titel

Southeastcon '89. Proceedings. Energy and Information Technologies in the Southeast., IEEE

Conference_Location

Columbia, SC

Type

conf

DOI

10.1109/SECON.1989.132411

Filename

132411