DocumentCode :
3317690
Title :
Vertical MOS transistor with threshold voltage adjustment
Author :
Mori, Kiyoshi
Author_Institution :
Sony Semicond. Corp., Japan
fYear :
1999
fDate :
1999
Firstpage :
245
Lastpage :
248
Abstract :
A sub-half micron channel length vertical MOS transistor was successfully developed for processing with less expensive process equipment. One of the important advantages of vertical MOS transistor technology is that the channel length scaling is not limited by the minimum lithographic resolution. The vertical MOS transistor, by virtue of increased W and smaller L, allowed the utilization of the side-walls of a 3D trench to form the transistor channel. The device will have much higher drain current and operating frequency than a planar MOS transistor patterned in the same planar surface area. Conventional processes such as ion implantation cannot be used to control the threshold voltage (Vt) of a vertical MOS transistor. A new method for diffusion of the impurities from a doped CVD film was successfully developed for vertical MOS transistor Vt adjustment
Keywords :
CVD coatings; MOSFET; diffusion; doping profiles; semiconductor doping; 3D trench side-walls; channel length; channel length scaling; doped CVD film; drain current; impurity diffusion; ion implantation; lithographic resolution; operating frequency; planar MOS transistor; planar surface area patterning; process equipment; threshold voltage adjustment; transistor channel; vertical MOS transistor; vertical MOS transistor technology; Design engineering; Diffusion processes; Fabrication; Impurities; MOSFETs; Manufacturing; Plasma temperature; Random access memory; Threshold voltage; Voltage control;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronics Manufacturing Technology Symposium, 1999. Twenty-Fourth IEEE/CPMT
Conference_Location :
Austin, TX
ISSN :
1089-8190
Print_ISBN :
0-7803-5502-4
Type :
conf
DOI :
10.1109/IEMT.1999.804828
Filename :
804828
Link To Document :
بازگشت