DocumentCode :
3317722
Title :
4-layer 3-D IC technologies for parallel signal processing
Author :
Yamazaki, K. ; Itoh, Y. ; Wada, A. ; Morimoto, K. ; Tomita, Y.
Author_Institution :
Matsushita Electr. Ind. Co. Ltd., Osaka, Japan
fYear :
1990
fDate :
9-12 Dec. 1990
Firstpage :
599
Lastpage :
602
Abstract :
A four-layer 3-D device used for parallel image signal processing was fabricated as an example of a primitive 3-D device. SOI (silicon-on-insulator) layers were formed by laser recrystallization. Mesa-type transistors having a stacked dielectric gate insulator were fabricated in a laser recrystallized Si island array. Thermally stable interconnections and contacts were realized by TiSi/sub x/ wiring and TiSi/sub x//TiN/TiSi/sub 2//Si-sub. contact structure. For the interlayer connections, a TiSi/sub x//TiN/W-plug/TiN/TiSi/sub x/ was used. The fabricated 3-D device consists of the following four layers: optical sensor, level-detector, memory, and arithmetic logic unit. The gate length of the SOI transistors is 2 mu m and the deviation of the threshold voltage is 4 approximately 5.5%. The number of transistors is about 110 K.<>
Keywords :
MOS integrated circuits; digital signal processing chips; image sensors; integrated circuit technology; recrystallisation; semiconductor-insulator boundaries; signal processing equipment; 2 micron; SOI; TiSi/sub x/-TiN-TiSi/sub 2/-Si; TiSi/sub x/-TiN-W; arithmetic logic unit; four-layer 3D IC technologies; gate length; image signal processing; laser recrystallization; level-detector; memory; mesa-type transistors; optical sensor; parallel signal processing; stacked dielectric gate insulator; thermally-stable interconnections; threshold voltage; Arithmetic; Array signal processing; Dielectrics and electrical insulation; Optical arrays; Optical sensors; Signal processing; Silicon on insulator technology; Three-dimensional integrated circuits; Tin; Wiring;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electron Devices Meeting, 1990. IEDM '90. Technical Digest., International
Conference_Location :
San Francisco, CA, USA
ISSN :
0163-1918
Type :
conf
DOI :
10.1109/IEDM.1990.237127
Filename :
237127
Link To Document :
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