DocumentCode :
3317754
Title :
Joint recognition / segmentation with cascaded multi-level feature classification and confidence propagation
Author :
Wenbo Liu ; Zhiding Yu ; Deyu Meng
Author_Institution :
Sch. of Electron. & Inf. Eng., South China Univ. of Technol., Guangzhou, China
fYear :
2013
fDate :
15-19 July 2013
Firstpage :
1
Lastpage :
4
Abstract :
In this paper, we propose a semantic object segmentation method based on cascaded superpixel-wise classification and segment-wise object class ranking. Inspired by the overwhelming parsing ability of human´s visual system in which non-local information are widely taken into consideration, our approach refers to higher-order information in case of ambiguous classifications. Different from many works on structured prediction for scene understanding, our work does not use complicated global probabilistic model, but adopts hierarchical cascaded classification for different levels of features. Another contribution is the confidence propagation through segment-wise object class ranking. Unlike many existing works which treat each classification unit equally, our method automatically discovers confident classifications and passes confidence to uncertain areas within segments obtained by hierarchical image segmentation. Such label correction process can significantly boost the segmentation accuracy.
Keywords :
feature extraction; image classification; image resolution; image segmentation; object recognition; ambiguous classifications; cascaded multilevel feature classification; cascaded superpixel-wise classification; confidence propagation; hierarchical cascaded classification; hierarchical image segmentation; label correction process; object recognition; scene understanding; segment-wise object class ranking; semantic object segmentation method; Accuracy; Feature extraction; Histograms; Image segmentation; Probabilistic logic; Semantics; Training; object recognition; scene understanding; semantic segmentation;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Multimedia and Expo Workshops (ICMEW), 2013 IEEE International Conference on
Conference_Location :
San Jose, CA
Type :
conf
DOI :
10.1109/ICMEW.2013.6618286
Filename :
6618286
Link To Document :
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