• DocumentCode
    3318339
  • Title

    Application of Swarm Intelligence to a digital excitation control system

  • Author

    Kim, Kiyong ; Rao, Pranesh ; Burnworth, Jeff

  • Author_Institution
    Basler Electr. Co., Highland, IL
  • fYear
    2008
  • fDate
    21-23 Sept. 2008
  • Firstpage
    1
  • Lastpage
    8
  • Abstract
    This paper describes an application of swarm intelligence (SI) technique to a digital excitation control system. Some of the modern voltage regulator systems are utilizing the proportional, integral, and derivative (PID) control for stabilization. Based on given excitation system parameters, several PID tuning approaches are reported. Since in general, these parameters are not available during commissioning, specifically the machine time constants, this lack of information causes a considerable time delay and cost of fuel usage for commissioning the automatic voltage regulator (AVR). To reduce the commissioning time and cost, the excitation system parameters are automatically identified and the PID gains are calculated using well-developed algorithms. A swarm intelligence (SI) technique is proposed to identify the system parameters and compared with recursive least square (RLS) with linearization via feedback. The performance of the proposed method is evaluated with several generator sets. With self-tuned PID gains, commissioning is accomplished very quickly with excellent performance results.
  • Keywords
    artificial intelligence; feedback; least squares approximations; stability; three-term control; voltage regulators; PID control; PID tuning; automatic voltage regulator; digital excitation control system; feedback; modern voltage regulator systems; recursive least square; stabilization; swarm intelligence; Control systems; Costs; Digital control; PD control; Particle swarm optimization; Pi control; Proportional control; Regulators; Three-term control; Voltage control;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Swarm Intelligence Symposium, 2008. SIS 2008. IEEE
  • Conference_Location
    St. Louis, MO
  • Print_ISBN
    978-1-4244-2704-8
  • Electronic_ISBN
    978-1-4244-2705-5
  • Type

    conf

  • DOI
    10.1109/SIS.2008.4668313
  • Filename
    4668313