• DocumentCode
    3318802
  • Title

    Strained layer quantum well heterostructure lasers

  • Author

    Coleman, J.J.

  • Author_Institution
    Compound Semicond. Microelectron. Lab., Illinois Univ., Urbana, IL, USA
  • fYear
    1990
  • fDate
    9-12 Dec. 1990
  • Firstpage
    125
  • Lastpage
    128
  • Abstract
    The metallurgical aspects of critical thickness in strained layer heterostructure systems, the effects of strain and quantum size effect on emission wavelength, and optical gain and threshold current density considerations associated with strained layer lasers are examined. The characteristics of broad area lasers under conditions of varying quantum well composition, thickness with respect to the critical thickness, growth conditions, stripe width, and other structural parameters are considered. More complicated InGaAs-GaAs strained layer quantum well heterostructure lasers, such as index guided laser structures, are also described. In contrast to GaAs quantum well heterostructure lasers, an antiguide is formed by strong free carrier effects in narrow oxide stripe InGaAs-GaAs strained layer lasers. This effect can be utilized in, laser arrays.<>
  • Keywords
    III-V semiconductors; current density; gallium arsenide; indium compounds; semiconductor junction lasers; size effect; InGaAs-GaAs; antiguide; broad area lasers; critical thickness; emission wavelength; free carrier effects; growth conditions; heterostructure lasers; index guided laser structures; narrow oxide stripe; optical gain; quantum size effect; quantum well; semiconductor lasers; strained layer; stripe width; threshold current density; Capacitive sensors; Gallium arsenide; Optical arrays; Quantum well lasers; Stimulated emission; Structural engineering; Threshold current;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices Meeting, 1990. IEDM '90. Technical Digest., International
  • Conference_Location
    San Francisco, CA, USA
  • ISSN
    0163-1918
  • Type

    conf

  • DOI
    10.1109/IEDM.1990.237211
  • Filename
    237211