Title :
Robust System Design
Author :
Mitra, Subhasish
Author_Institution :
Dept. of Electr. Eng., Stanford Univ., Stanford, CA, USA
Abstract :
Robust system design ensures that future systems continue to meet user expectations despite rising levels of underlying disturbances. This paper discusses two essential aspects of robust system design: 1. Effective post-silicon validation, despite staggering complexity of future systems, using a new technique called Instruction Footprint Recording and Analysis (IFRA). 2. Cost-effective design of systems that overcome CMOS reliability challenges through built-in tolerance to errors in hardware during system operation. A combination of Built-In Soft Error Resilience (BISER) and circuit failure prediction, together with on-line self-test/diagnostics and software-orchestrated optimization across multiple abstraction layers, enable design of cost-effective resilient systems.
Keywords :
CMOS integrated circuits; automatic testing; built-in self test; error correction; failure analysis; fault tolerance; integrated circuit design; integrated circuit reliability; integrated circuit testing; CMOS reliability; built-in error tolerance; built-in soft error resilience; circuit failure prediction; instruction footprint recording and analysis; online self-test; post-silicon validation; robust system design; self-diagnostics; software-orchestrated optimization; user expectation; Circuits; Computer bugs; Computer crashes; Costs; Failure analysis; Hardware; Logic design; Open source software; Robustness; System analysis and design; BISER; Built-In Soft Error Resilience; Circuit Failure Prediction; IFRA; On-line Self-Test; Reliability; Robust systems; Validation; aging; post-silicon validation; soft errors;
Conference_Titel :
VLSI Design, 2010. VLSID '10. 23rd International Conference on
Conference_Location :
Bangalore
Print_ISBN :
978-1-4244-5541-6
DOI :
10.1109/VLSI.Design.2010.77
