DocumentCode
3319367
Title
Conditions for removing intersample ripples in multirate control
Author
Tangirala, Arm K. ; Shah, Sirish L. ; Chen, Tongwen
Author_Institution
Dept. of Chem. & Mater. Eng., Alberta Univ., Edmonton, Alta., Canada
Volume
3
fYear
1999
fDate
9-12 May 1999
Firstpage
1585
Abstract
Multirate systems arise when signals of interest are sampled at different rates. Measurements from chemical processes are typically available at different sampling rates. For example, composition estimates in a distillation column are available at a much slower rate than flow, temperature and pressure measurements. Multirate systems pose a challenging problem due to several reasons such as increased complexity design, time-varying nature, etc. Systems consisting of fast-rate control moves and slow-sampled outputs are a common scenario in chemical processes and of practical interest. Traditionally, inferential techniques based on secondary measurements have been used to design the fast-rate input moves. Lifting techniques conveniently transform multirate systems to single-rate lifted systems with increased dimensionality. Controllers designed using lifting techniques require that certain causality constraints are satisfied. We show firstly, that intersample ripples can arise in the closed-loop output of a multirate system as a result of non-uniform gains of the discrete lifted system and inverse lifting. Secondly, we present conditions on the controller gains to avoid intersample ripples.
Keywords
MIMO systems; chemical technology; closed loop systems; process control; sampled data systems; signal sampling; causality constraints; chemical processes; complexity design; composition estimates; discrete lifted system; distillation column; fast-rate control moves; intersample ripples; inverse lifting; lifting techniques; multirate control; multirate systems; nonuniform gains; single-rate lifted systems; slow-sampled outputs; Chemical processes; Control systems; Distillation equipment; Frequency; MIMO; Pressure measurement; Sampling methods; Switches; Temperature measurement; Time varying systems;
fLanguage
English
Publisher
ieee
Conference_Titel
Electrical and Computer Engineering, 1999 IEEE Canadian Conference on
Conference_Location
Edmonton, Alberta, Canada
ISSN
0840-7789
Print_ISBN
0-7803-5579-2
Type
conf
DOI
10.1109/CCECE.1999.804949
Filename
804949
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