Title :
Coastal characterization from hyperspectral imagery: An intercomparison of retrieval properties from three coast types
Author :
Bachmann, Charles M. ; Nichols, C. Reid ; Montes, Marcos J. ; Fusina, Robert A. ; Li, Rong-Rong ; Gross, Carl ; Fry, John ; Parrish, Chris ; Sellars, Jon ; White, Stephen A. ; Jones, Christopher A. ; Lee, Krista
Author_Institution :
Remote Sensing Div., Naval Res. Lab., Washington, DC, USA
Abstract :
Over the past three years, the Naval Research Laboratory has conducted three remote sensing campaigns in regions which included barrier island, coral, and mangrove coastal characteristics. These investigations were conducted at the Virginia Coast Reserve during September 2007, in and around Kaneohe and Waimanalo Bays during January and February 2009, and along the Queensland coast in Australia during May 2009. During each of the studies, hyperspectral imagery (HSI) was acquired over the site in conjunction with both land and water spectral and geotechnical measurements. For coastal classification, such as retrievals of bottom reflectance, bathymetry, beach composition, and vegetation type, subtle variations in spectral properties of physical and biological features are often significant. Beach composition in these coast types differed dramatically due to the origin of the sands. These findings suggest the need to develop models specific to a particular coast type.
Keywords :
bathymetry; oceanographic regions; oceanographic techniques; remote sensing; vegetation; AD 2007 09; AD 2009 01; AD 2009 02; AD 2009 05; Australia; Kaneohe Bay; Naval Research Laboratory; Queensland coast; Virginia Coast Reserve; Waimanalo Bay; bathymetry; beach composition; bottom reflectance; coastal classification; hyperspectral imagery; remote sensing; vegetation type; Grain size; Hyperspectral imaging; Reflectivity; Sea measurements; Vegetation mapping; coast type; environmental factors; hyperspectral imagery; remote sensing; spectroscopy;
Conference_Titel :
Geoscience and Remote Sensing Symposium (IGARSS), 2010 IEEE International
Conference_Location :
Honolulu, HI
Print_ISBN :
978-1-4244-9565-8
Electronic_ISBN :
2153-6996
DOI :
10.1109/IGARSS.2010.5650660