• DocumentCode
    3320958
  • Title

    Applying integrated nested laplace approximation to the superresolution problem

  • Author

    Camponez, Marcelo Oliveira ; Salles, Evandro O Teatini ; Sarcinelli-Filho, Màrio

  • Author_Institution
    Grad. Program on Electr. Eng., Fed. Univ. of Espirito Santo Vitoria, Vitoria, Brazil
  • fYear
    2011
  • fDate
    14-17 Dec. 2011
  • Firstpage
    246
  • Lastpage
    252
  • Abstract
    Superresolution is a term used to describe the generation of a high-resolution image from a sequence of similar low-resolution images. In 2011 we derived a closed form to resolve the superresolution problem, thus proposing a new algorithm to generate the high-resolution image. However, the choice of an hyperparameter (λ), involved in the fusion of the low-resolution images, is still heuristically defined. Thus, to get a good value for such hyperparameter is somewhat troublesome, demanding much experience or a lot of attempts. In this context, this paper proposes a fully automatic method for choosing such hyperparameter, thus providing a fully analytical solution for the superresolution problem. In the solution it is used, by the first time in the image processing field, a new Bayesian inference method known as Integrated Nested Laplace Approximation (INLA). Several simulations, from which two results are here presented, show that the proposed algorithm performs better than other superresolution algorithms yet available in the literature.
  • Keywords
    approximation theory; belief networks; image resolution; inference mechanisms; Bayesian inference method; INLA; fully automatic method; high-resolution image; hyperparameter; image processing; integrated nested laplace approximation; low-resolution images; superresolution problem; Approximation algorithms; Approximation methods; Bayesian methods; Image resolution; Mathematical model; Strontium; Vectors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Signal Processing and Information Technology (ISSPIT), 2011 IEEE International Symposium on
  • Conference_Location
    Bilbao
  • Print_ISBN
    978-1-4673-0752-9
  • Electronic_ISBN
    978-1-4673-0751-2
  • Type

    conf

  • DOI
    10.1109/ISSPIT.2011.6151568
  • Filename
    6151568