• DocumentCode
    332384
  • Title

    Charging characteristics on dielectric surface by different charging process in vacuum

  • Author

    Yamano, Y. ; Ohashi, A. ; Kato, K. ; Hakamata, Y. ; Okubo, H.

  • Author_Institution
    Nagoya Univ., Japan
  • Volume
    1
  • fYear
    1998
  • fDate
    17-21 Aug 1998
  • Firstpage
    174
  • Abstract
    This paper describes the charging characteristics on a dielectric surface in a vacuum by different types of charging process: electron irradiation by electron beam; and field emission by triple junction under negative DC high voltage application. The authors measured the 2-dimensional distribution of electrostatic charging on the dielectric surface in-situ. Experimental results revealed that the negative charge distribution by the electron beam had a conical shape all over the surface. On the other hand, for the triple junction, it was an acute distribution around the triple junction. Moreover, they quantitatively investigated the difference of the 2-dimensional charging distribution using some shape parameters between above mentioned two charging processes. In addition, the authors examined the time decay characteristics of the surface potential on the dielectrics in vacuum
  • Keywords
    alumina; electron beam effects; electron field emission; electrostatics; insulation testing; surface charging; surface discharges; surface potential; vacuum breakdown; vacuum insulation; 2-dimensional charging distribution; Al2O3; charging process; dielectric surface charging characteristics; electron beam irradiation; field emission; negative DC high voltage application; surface potential; time decay characteristics; triple junction; vacuum; Dielectric measurements; Dielectrics and electrical insulation; Electron beams; Electron emission; Electrostatics; Space charge; Space technology; Surface charging; Surface discharges; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Discharges and Electrical Insulation in Vacuum, 1998. Proceedings ISDEIV. XVIIIth International Symposium on
  • Conference_Location
    Eindhoven
  • ISSN
    1093-2941
  • Print_ISBN
    0-7803-3953-3
  • Type

    conf

  • DOI
    10.1109/DEIV.1998.740602
  • Filename
    740602