• DocumentCode
    3324787
  • Title

    Analysis on the spectral reflectance response to snow contaminants in northeast China

  • Author

    Lei, Xiaochun ; Song, Kaishan ; Wang, Zongming ; Du, Jia ; Wu, Yanqing ; Wang, Yuandong ; Tang, Xuguang ; Zeng, Lihong ; Jiang, Guangjia ; Liu, Dianwei ; Zhang, Bai

  • Author_Institution
    Northeast Inst. of Geogr. & Agric. Ecology, CAS, Changchun, China
  • fYear
    2010
  • fDate
    25-30 July 2010
  • Firstpage
    1741
  • Lastpage
    1744
  • Abstract
    By simulating atmospheric deposition experiment, this paper analyzed the relationship between the measured spectral reflectance and the concentrations of contaminants in the snow. It is found that the visible spectrum is sensitive to snow contaminants. From 350nm to 850nm, with the increase concentrations of contaminants in snow, snow reflectivity dramatically decreases. We get the conclusion that the most sensitive bands to snow contaminants are 384nm, 450nm and 1495nm.Using the non-linear regression method to analyze the relationship between spectral reflectance and the contaminants. The results showed the reflectivity of snow at visible bands logarithmically decreases with the snow contaminants increasing; the R2 can reach 0.9.To the contrary, the spectral reflectance at nearinfrared increases with the snow contaminants increasing. Therefore, this method can be combined satellite image to forecast the contaminants in the snow at large-scale.
  • Keywords
    geophysical image processing; remote sensing; snow; atmospheric deposition experiment; hyperspectral remote sensing; nonlinear regression method; northeast China; satellite image; snow contaminants; snow reflectivity; spectral reflectance; visible bands; visible spectrum; Atmospheric measurements; Atmospheric modeling; Correlation; Pollution measurement; Reflectivity; Snow; Surface contamination; Contaminants; Hyperspectral remote sensing; Snow reflectivity;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Geoscience and Remote Sensing Symposium (IGARSS), 2010 IEEE International
  • Conference_Location
    Honolulu, HI
  • ISSN
    2153-6996
  • Print_ISBN
    978-1-4244-9565-8
  • Electronic_ISBN
    2153-6996
  • Type

    conf

  • DOI
    10.1109/IGARSS.2010.5650972
  • Filename
    5650972