DocumentCode
3324940
Title
Probabilistic Event Extraction from RFID Data
Author
Khoussainova, Nodira ; Balazinska, Magdalena ; Suciu, Dan
Author_Institution
Comput. Sci. & Eng. Dept., Univ. of Washington, Seattle, WA
fYear
2008
fDate
7-12 April 2008
Firstpage
1480
Lastpage
1482
Abstract
We present PEEX, a system that enables applications to define and extract meaningful probabilistic high-level events from RFID data. PEEX effectively copes with errors in the data and the inherent ambiguity of event extraction.
Keywords
radiofrequency identification; RFID data; probabilistic event extraction; probabilistic high-level events; Application software; Cleaning; Computer errors; Computer science; Data engineering; Data mining; Event detection; Face detection; Radiofrequency identification; Uncertainty;
fLanguage
English
Publisher
ieee
Conference_Titel
Data Engineering, 2008. ICDE 2008. IEEE 24th International Conference on
Conference_Location
Cancun
Print_ISBN
978-1-4244-1836-7
Electronic_ISBN
978-1-4244-1837-4
Type
conf
DOI
10.1109/ICDE.2008.4497596
Filename
4497596
Link To Document