DocumentCode
3326153
Title
0.5-V sub-ns open-BL SRAM array with mid-point-sensing multi-power 5T cell
Author
Itoh, Kiyoo ; Shaik, Khaja Ahmad ; Amara, Amara
Author_Institution
Inst. Super. d´Electron. de Paris, Issy-les-Moulineaux, France
fYear
2015
fDate
24-27 May 2015
Firstpage
2892
Lastpage
2895
Abstract
To achieve 0.5-V high-speed SRAMs, two proposals are demonstrated. One is a multi-power-supply five-transistor cell (5T cell), combined with a boosted word-line voltage and a mid-point sensing enabled by precharging bit-lines to VDD/2. The other is a partial activation of a multi-divided open-bit-line array without significant area penalty. Layout and post-layout simulation with a 28-nm fully-depleted planar-logic SOI MOSFET reveal that a 5T-cell 4-kb array in a 128-kb SRAM core is able to achieve x6 faster and x14 lower power than the counterpart 6T-cell array, suggesting a possibility of a 540-ps cycle time at 0.5 V.
Keywords
SRAM chips; integrated circuit layout; area penalty; bit line boosting; boosted word line voltage; fully depleted planar logic SOI MOSFET; midpoint sensing multipower 5T cell; multipower supply five transistor cell; open-BL SRAM array; post layout simulation; size 28 nm; voltage 0.5 V; Arrays; Layout; Leakage currents; Microprocessors; Random access memory; Sensors; 0.5-V 5T-cell SRAM array; boosted word-line; mid-point sensing; multi-divided open bitlines;
fLanguage
English
Publisher
ieee
Conference_Titel
Circuits and Systems (ISCAS), 2015 IEEE International Symposium on
Conference_Location
Lisbon
Type
conf
DOI
10.1109/ISCAS.2015.7169291
Filename
7169291
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