• DocumentCode
    3326153
  • Title

    0.5-V sub-ns open-BL SRAM array with mid-point-sensing multi-power 5T cell

  • Author

    Itoh, Kiyoo ; Shaik, Khaja Ahmad ; Amara, Amara

  • Author_Institution
    Inst. Super. d´Electron. de Paris, Issy-les-Moulineaux, France
  • fYear
    2015
  • fDate
    24-27 May 2015
  • Firstpage
    2892
  • Lastpage
    2895
  • Abstract
    To achieve 0.5-V high-speed SRAMs, two proposals are demonstrated. One is a multi-power-supply five-transistor cell (5T cell), combined with a boosted word-line voltage and a mid-point sensing enabled by precharging bit-lines to VDD/2. The other is a partial activation of a multi-divided open-bit-line array without significant area penalty. Layout and post-layout simulation with a 28-nm fully-depleted planar-logic SOI MOSFET reveal that a 5T-cell 4-kb array in a 128-kb SRAM core is able to achieve x6 faster and x14 lower power than the counterpart 6T-cell array, suggesting a possibility of a 540-ps cycle time at 0.5 V.
  • Keywords
    SRAM chips; integrated circuit layout; area penalty; bit line boosting; boosted word line voltage; fully depleted planar logic SOI MOSFET; midpoint sensing multipower 5T cell; multipower supply five transistor cell; open-BL SRAM array; post layout simulation; size 28 nm; voltage 0.5 V; Arrays; Layout; Leakage currents; Microprocessors; Random access memory; Sensors; 0.5-V 5T-cell SRAM array; boosted word-line; mid-point sensing; multi-divided open bitlines;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Circuits and Systems (ISCAS), 2015 IEEE International Symposium on
  • Conference_Location
    Lisbon
  • Type

    conf

  • DOI
    10.1109/ISCAS.2015.7169291
  • Filename
    7169291