DocumentCode
332619
Title
Bridging A Gap Between Microelectronics And Micromechanics Testing
Author
Lubaszewski, Marcelo
fYear
1998
fDate
2-4 Dec 1998
Firstpage
513
Lastpage
513
Keywords
Automatic testing; Design automation; Detectors; Electrical capacitance tomography; Electrical fault detection; Electronic equipment testing; Equations; Face detection; Failure analysis; Fault detection; Microelectronics; Thermal sensors;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Symposium, 1998. ATS '98. Proceedings. Seventh Asian
ISSN
1081-7735
Print_ISBN
0-8186-8277-9
Type
conf
DOI
10.1109/ATS.1998.741667
Filename
741667
Link To Document