DocumentCode
3326686
Title
Automatic selection of ROIs using a model-based clustering approach
Author
Segovia, F. ; Górriz, J.M. ; Ramirez, J. ; Salas-Gonzalez, D. ; Illan, I.A. ; Lopez, M. ; Chaves, R. ; Padilla, P. ; Puntonet, C.G.
Author_Institution
Dept. of Signal Theor., Networking & Commun., Univ. of Granada, Granada, Spain
fYear
2009
fDate
Oct. 24 2009-Nov. 1 2009
Firstpage
3194
Lastpage
3198
Abstract
This paper presents a new method for automatic selection of Regions of Interest (ROIs) of functional brain images based on a Gaussian Mixture Model (GMM). This method allows avoiding the so-called small sample size problem in the construction of a CAD system that performs the automatic diagnosis of Alzheimers disease (AD). First we generate an image that holds the differences between normal and AD subjects and then, we model the ROIs from this image by using GMM and the Expectation Maximization algorithm. These regions are used to select a reduced set of features from the activation map of each patient and allow us to train statistical classifiers such as Support Vector Machines (SVMs). We have tested this approach on a SPECT images database and the accuracy rate achieved by the CAD system was 94.5%. This value significantly improves the results obtained by previously developed approaches.
Keywords
brain; diseases; expectation-maximisation algorithm; medical image processing; patient diagnosis; single photon emission computed tomography; support vector machines; Alzheimers disease; CAD system; Gaussian mixture model; SPECT images database; accuracy rate; activation map; automatic diagnosis; automatic selection; expectation maximization algorithm; functional brain images; model-based clustering approach; sample size problem; support vector machines; Alzheimer´s disease; Brain modeling; Computer architecture; Coronary arteriosclerosis; Image databases; Image generation; Nuclear and plasma sciences; Paper technology; Positron emission tomography; Support vector machines; Alzheimer; EM algorithm; Gaussian Mixture Model; SPECT;
fLanguage
English
Publisher
ieee
Conference_Titel
Nuclear Science Symposium Conference Record (NSS/MIC), 2009 IEEE
Conference_Location
Orlando, FL
ISSN
1095-7863
Print_ISBN
978-1-4244-3961-4
Electronic_ISBN
1095-7863
Type
conf
DOI
10.1109/NSSMIC.2009.5401704
Filename
5401704
Link To Document