• DocumentCode
    332736
  • Title

    Node sampling: a robust RTL power modeling approach

  • Author

    Bogliolo, A. ; Benini, L.

  • Author_Institution
    Dipt. di Elettronica Inf. e Sistemistica, Bologna Univ., Italy
  • fYear
    1998
  • fDate
    8-12 Nov. 1998
  • Firstpage
    461
  • Lastpage
    467
  • Abstract
    We propose a robust RTL power modeling methodology for functional units. Our models are consistently accurate over a wide range of input statistics, they are automatically constructed and can provide pattern-by-pattern power estimates. An additional desirable feature of our modeling methodology is the capability of accounting for the impact of technology variations, library changes and synthesis tools. Our methodology is based on the concept of node sampling, as opposed to more traditional approaches based on input sampling. We analyze the theoretical properties of node sampling and we formally show that it is a statistically sound approach. The superior robustness of our method is due to its limited dependency on pattern based characterization.
  • Keywords
    logic CAD; power electronics; statistical analysis; functional units; input statistics; library changes; node sampling; pattern-by-pattern power estimates; register transfer level; robust RTL power modeling approach; robust RTL power modeling methodology; robustness; statistically sound approach; synthesis tools; technology variations; Adders; Business; Computational modeling; Digital circuits; Finite impulse response filter; Libraries; Permission; Robustness; Sampling methods; Time to market;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer-Aided Design, 1998. ICCAD 98. Digest of Technical Papers. 1998 IEEE/ACM International Conference on
  • Conference_Location
    San Jose, CA, USA
  • Print_ISBN
    1-58113-008-2
  • Type

    conf

  • DOI
    10.1109/ICCAD.1998.144308
  • Filename
    742945