• DocumentCode
    332817
  • Title

    Reduction of errors due to source and meter in the nonlinearity test

  • Author

    Hsieh, S. L Luke

  • fYear
    1998
  • fDate
    18-23 Oct 1998
  • Firstpage
    254
  • Lastpage
    257
  • Abstract
    Nonlinearity test is required for many products of various applications, such as in consumer and is difficult to rest when sources and meters are nonlinear. A novel method using digital signal processing (DSP) techniques is presented to reduce the errors introduced by nonlinear source and meter. It uses the Taylor series representation to model the nonlinearity of source, meter, and device under lest (DUT). The nonlinearity coefficients of the overall stages are distorted by the nonlinear source and meter. These coefficients can be corrected by the nonlinearity coefficients with the DUT bypassed; accordingly the errors introduced by the nonlinear source and meter are minimized
  • Keywords
    digital signal processing chips; electric distortion measurement; electronic equipment testing; nonlinear systems; Taylor series representation; device under lest; digital signal processing; nonlinear source; nonlinear source and meter; nonlinearity coefficients; nonlinearity test; Digital signal processing; Distortion measurement; Error correction; Harmonic analysis; Instruments; Nonlinear distortion; Signal analysis; Taylor series; Testing; Total harmonic distortion;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 1998. Proceedings., International
  • Conference_Location
    Washington, DC
  • ISSN
    1089-3539
  • Print_ISBN
    0-7803-5093-6
  • Type

    conf

  • DOI
    10.1109/TEST.1998.743160
  • Filename
    743160