DocumentCode
332817
Title
Reduction of errors due to source and meter in the nonlinearity test
Author
Hsieh, S. L Luke
fYear
1998
fDate
18-23 Oct 1998
Firstpage
254
Lastpage
257
Abstract
Nonlinearity test is required for many products of various applications, such as in consumer and is difficult to rest when sources and meters are nonlinear. A novel method using digital signal processing (DSP) techniques is presented to reduce the errors introduced by nonlinear source and meter. It uses the Taylor series representation to model the nonlinearity of source, meter, and device under lest (DUT). The nonlinearity coefficients of the overall stages are distorted by the nonlinear source and meter. These coefficients can be corrected by the nonlinearity coefficients with the DUT bypassed; accordingly the errors introduced by the nonlinear source and meter are minimized
Keywords
digital signal processing chips; electric distortion measurement; electronic equipment testing; nonlinear systems; Taylor series representation; device under lest; digital signal processing; nonlinear source; nonlinear source and meter; nonlinearity coefficients; nonlinearity test; Digital signal processing; Distortion measurement; Error correction; Harmonic analysis; Instruments; Nonlinear distortion; Signal analysis; Taylor series; Testing; Total harmonic distortion;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 1998. Proceedings., International
Conference_Location
Washington, DC
ISSN
1089-3539
Print_ISBN
0-7803-5093-6
Type
conf
DOI
10.1109/TEST.1998.743160
Filename
743160
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