Title :
CT spectral projection imaging
Author :
Hsieh, Jiang ; Chandra, Naveen ; Woloschek, Steve ; Senzig, Bob ; Aluri, Srinivas ; Benson, Thomas ; Wu, Xiaoye ; Okerlund, Darin ; Li, Baojun
Author_Institution :
GE Healthcare, Waukesha, WI, USA
fDate :
Oct. 24 2009-Nov. 1 2009
Abstract :
Dual energy x-ray computed tomography (DECT) has gained a significant attention in recent years. The technology offers the potential to differentiate different materials, and therefore provides the possibility of identifying different pathologies. In this paper, we present a dual-energy projection imaging technique by utilizing the scout data acquisition mode of CT in conjunction with the fast-kVp switching capability. Phantom experiments have shown its advantage in removing overlapping structures and improves the visualization of small structure inside the body.
Keywords :
computerised tomography; data acquisition; medical image processing; phantoms; CT spectral projection imaging; dual energy X-ray computed tomography; fast-kVp switching capability; overlapping structures; phantom experiments; scout data acquisition mode; Attenuation; Computed tomography; Electromagnetic scattering; Energy measurement; Integral equations; Optical imaging; Particle scattering; Photovoltaic effects; X-ray imaging; X-ray scattering;
Conference_Titel :
Nuclear Science Symposium Conference Record (NSS/MIC), 2009 IEEE
Conference_Location :
Orlando, FL
Print_ISBN :
978-1-4244-3961-4
Electronic_ISBN :
1095-7863
DOI :
10.1109/NSSMIC.2009.5401803