DocumentCode
3328615
Title
Test process optimization: closing the gap in the defect spectrum
Author
Barrett, Norma ; Martin, Simon ; Dislis, Chryssa
Author_Institution
Sector of Network Solution, Motorola Ireland Ltd., Cork, Ireland
fYear
1999
fDate
1999
Firstpage
124
Lastpage
129
Abstract
This paper describes our methodology of tuning the test process of the Motorola Operations and Maintenance Center product to systematically reduce field defects. The benefits include improved test cases, reduced defects and the availability of up to date field data for feature verification
Keywords
program testing; software fault tolerance; software maintenance; GSM cellular products; Motorola product test process; defect coverage; defect spectrum; feature verification; mapping process gaps; orthogonal defect classification; reduced field defects; requirements-derived test; software testing tuning model; systematic trend analysis; test process optimization; Base stations; Cellular networks; Feedback; GSM; Graphical user interfaces; Intelligent networks; Land mobile radio cellular systems; Software testing; System testing; Time to market;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 1999. Proceedings. International
Conference_Location
Atlantic City, NJ
ISSN
1089-3539
Print_ISBN
0-7803-5753-1
Type
conf
DOI
10.1109/TEST.1999.805621
Filename
805621
Link To Document