• DocumentCode
    3328666
  • Title

    Towards reducing “functional only” fails for the UltraSPARCTM microprocessors

  • Author

    Kinra, Anjali

  • Author_Institution
    Texas Instrum. Inc., Stafford, TX, USA
  • fYear
    1999
  • fDate
    1999
  • Firstpage
    147
  • Lastpage
    154
  • Abstract
    A description of test coverage on the UltraSPARC family of devices is presented. Techniques developed with the intent to reduce “functional only” failures are discussed along with the resulting impact to the manufacturing process
  • Keywords
    automatic test pattern generation; computer debugging; design for manufacture; design for testability; embedded systems; fault diagnosis; integrated circuit testing; logic testing; microprocessor chips; pipeline processing; RamTest array tests; UltraSPARC microprocessors; debug methods; embedded RAM arrays; fault coverage; full scan logic; internal scan diagnosis; reduced functional only fails; stuck-at-fault ATPG; test coverage; Automatic test pattern generation; CMOS technology; Clocks; Failure analysis; Instruments; Manufacturing processes; Microprocessors; Pattern analysis; Silicon; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 1999. Proceedings. International
  • Conference_Location
    Atlantic City, NJ
  • ISSN
    1089-3539
  • Print_ISBN
    0-7803-5753-1
  • Type

    conf

  • DOI
    10.1109/TEST.1999.805624
  • Filename
    805624
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3328666