• DocumentCode
    3328804
  • Title

    OATS emission data compared with free space emission data

  • Author

    Leferink, Frank B J ; Groot-Boerle, Dick J. ; Puylaert, B.R.M.

  • Author_Institution
    Environ. Test Lab., Hollandse Signaalapparaten B.V., Hengelo, Netherlands
  • fYear
    195
  • fDate
    14-18 Aug 195
  • Firstpage
    333
  • Lastpage
    337
  • Abstract
    This paper presents the correction for free space (FS) with respect to open area test site (OATS) radiated emission data. This correction is applicable to levels measured in a complete absorber lined chamber (CALC) in order to compare these levels with legislative requirements, which are based on OATS measurements. The correction is also applicable to theoretical radiated emission data in order to compare these data with OATS measurement data. Only the influence of the ray paths on the site attenuation (SA) as obtained on an OATS and in a CALC is given. The effects of the antenna patterns, antenna mismatch, influence of metal on the antenna and near field effects are not treated. The correction for a small source located 1 m above the ground plane is given as an example. It is used to compare a practical CALC with an OATS via the site attenuation. A Pascal program used to calculate the correction for any setup is given
  • Keywords
    Pascal; anechoic chambers; antenna testing; attenuation measurement; electrical engineering; electrical engineering computing; electromagnetic interference; legislation; 1 m; OATS emission data; OATS measurement data; Pascal program; complete absorber lined chamber; free space emission data; ground plane; legislative requirements; open area test site; radiated emission data correction; ray paths; site attenuation; source; Antenna measurements; Attenuation; Bibliographies; Communication cables; Impedance measurement; Laboratories; Loaded antennas; Open area test sites; Receiving antennas; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electromagnetic Compatibility, 1995. Symposium Record., 1995 IEEE International Symposium on
  • Conference_Location
    Atlanta, GA
  • Print_ISBN
    0-7803-3608-9
  • Type

    conf

  • DOI
    10.1109/ISEMC.1995.523575
  • Filename
    523575