DocumentCode
3329673
Title
Laplacian based structure-aware error diffusion
Author
Lee, Han-Sang ; Kong, Kang-Kook ; Hong, Ki-Sang
Author_Institution
Dept. of Comput. & Commun. Eng., POSTECH, Pohang, South Korea
fYear
2010
fDate
26-29 Sept. 2010
Firstpage
525
Lastpage
528
Abstract
In this paper, we propose a new halftoning scheme that preserves the structure and tone similarities of images while maintaining the simplicity of Floyd-Steinberg error diffusion. Our algorithm is based on the Floyd-Steinberg error diffusion algorithm, but the threshold modulation part is modified to improve the over-blurring issue of the Floyd-Steinberg error diffusion algorithm. By adding some structural information on images obtained using the Laplacian operator to the quantizer thresholds, the structural details in the textured region can be preserved. The visual artifacts of the original error diffusion that is usually visible in the uniform region is greatly reduced by adding noise to the thresholds. This is especially true for the low contrast region because most existing error diffusion algorithms cannot preserve structural details but our algorithm preserves them clearly using threshold modulation. Our algorithm has been evaluated using various types of images including some with the low contrast region and assessed numerically using the MSSIM measure with other existing state-of-art halftoning algorithms. The results show that our method performs better than existing approaches both in the textured region and in the uniform region with the faster computation speed.
Keywords
image restoration; image segmentation; Floyd-Steinberg error diffusion; Laplacian operator; contrast region; halftoning scheme; image blurring; threshold modulation; visual artifacts; Algorithm design and analysis; Image edge detection; Laplace equations; Modulation; Noise; Pixel; Visualization; Halftoning; Laplacian; error diffusion; low contrast; structure-aware; threshold modulation;
fLanguage
English
Publisher
ieee
Conference_Titel
Image Processing (ICIP), 2010 17th IEEE International Conference on
Conference_Location
Hong Kong
ISSN
1522-4880
Print_ISBN
978-1-4244-7992-4
Electronic_ISBN
1522-4880
Type
conf
DOI
10.1109/ICIP.2010.5651243
Filename
5651243
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