DocumentCode
3330501
Title
Analog Fault Simulation: Need it? No. It is already done
Author
Atwood, Eugene R.
Author_Institution
IBM Microelectronics Division
fYear
1999
fDate
1999
Firstpage
649
Lastpage
649
Keywords
Analog circuits; Circuit faults; Circuit simulation; Circuit testing; Environmental economics; Logic devices; Microelectronics; Semiconductor process modeling; Switches; Switching circuits;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 1999. Proceedings. International
ISSN
1089-3539
Print_ISBN
0-7803-5753-1
Type
conf
DOI
10.1109/TEST.1999.805790
Filename
805790
Link To Document