Clustering based techniques for IDDQ testing

A new technique for evaluating I_DDQ data using a clustering based approach is presented. While prevailing I_DDQ test techniques rely on a fixed threshold or the current signature of an IC, the proposed technique relies on abnormalities of the I_DDQ distribution of a device with respect to other devices in the test set. Results of applying this technique to data collected on a high volume graphics chip are described. Results are also compared to the conventional single threshold approach, and benefits of the new technique are presented