Title :
Design-for-test methodology for Motorola PowerPCTM microprocessors
Author :
Abadir, Magdy ; Raina, Rajesh
Author_Institution :
Motorola Inc., Austin, TX, USA
Abstract :
Testing of modern microprocessor designs remains a challenging problem. At Motorola´s Somerset Design Center, we rely heavily on Design-For-Test (DFT) to address these challenges. To date our efforts have been very successful. This paper reviews our DFT methodology and how the DFT group is dealing with the new challenges that are facing PowerPCTM microprocessor designs
Keywords :
design for testability; integrated circuit testing; logic testing; microprocessor chips; DFT; Motorola PowerPCmicroprocessors; Motorola Somerset Design Center; microprocessor design; Bandwidth; Costs; Design for testability; Digital signal processors; Distributed computing; Frequency; Hardware; Internet; Microprocessors; Testing;
Conference_Titel :
Test Conference, 1999. Proceedings. International
Conference_Location :
Atlantic City, NJ
Print_ISBN :
0-7803-5753-1
DOI :
10.1109/TEST.1999.805812