DocumentCode :
3331011
Title :
The test requirements model (TeRM) communicating test information throughout the product life cycle
Author :
Shombert, Lee A. ; Davis, Danny C. ; Bukata, Eric M.
Author_Institution :
AverStar Inc., Vienna, VA, USA
fYear :
1999
fDate :
1999
Firstpage :
868
Lastpage :
876
Abstract :
Test information that is necessary to properly verify product functionality and performance and isolate faults is collected throughout the product life cycle. Unfortunately, this information is seldom captured in a format that can be reused at subsequent life-cycle stages. This paper describes a formal information-based methodology, called the Test Requirements Model (TeRM) that can be shown to facilitate the transfer of test-related product information between various stages of the life cycle and to higher-level assemblies in a system (including embedded cores in integrated circuits.)
Keywords :
design for testability; electronic equipment testing; product development; production testing; systems engineering; TeRM; embedded cores; formal information-based methodology; higher-level assemblies; integrated circuits; performance; product functionality; product life cycle; test requirements model; Assembly systems; Automatic testing; Circuit faults; Circuit testing; Integrated circuit modeling; Integrated circuit testing; Life testing; Power supplies; Springs; System testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Test Conference, 1999. Proceedings. International
Conference_Location :
Atlantic City, NJ
ISSN :
1089-3539
Print_ISBN :
0-7803-5753-1
Type :
conf
DOI :
10.1109/TEST.1999.805818
Filename :
805818
Link To Document :
بازگشت