Title :
Practical optical waveform probing of flip-chip CMOS devices
Author :
Wilsher, Kenneth R. ; Lo, William K.
Author_Institution :
Schlumberger Technol., San Jose, CA, USA
Abstract :
Internal node waveforms are recovered through the backside of flip-chip CMOS devices under real test conditions using a commercially available tool. A novel noise reduction scheme significantly reduces acquisition times by canceling environmental and laser noise. Long test loops can be examined with 10 GHz bandwidth using a 35 ps pulse width mode-locked laser source and equivalent-time-sampling. Other system issues, including phase locking the fixed 100 MHz laser clock to a variable frequency tester clock, will also be discussed
Keywords :
CMOS integrated circuits; electro-optical modulation; flip-chip devices; integrated circuit testing; optical microscopy; optical phase locked loops; wave analysers; waveform analysis; 10 GHz; confocal laser scanning microscope; debugging; equivalent-time-sampling; flip-chip CMOS devices; internal node waveforms; laser clock; long test loops; noise reduction scheme; optical waveform probing; phase locking; pulse width mode-locked laser source; real test conditions; reduced acquisition time; variable frequency tester clock; Bandwidth; Clocks; Laser mode locking; Laser noise; Noise cancellation; Noise reduction; Optical devices; Optical noise; Testing; Working environment noise;
Conference_Titel :
Test Conference, 1999. Proceedings. International
Conference_Location :
Atlantic City, NJ
Print_ISBN :
0-7803-5753-1
DOI :
10.1109/TEST.1999.805825
