DocumentCode :
3331154
Title :
On-line fault detection in DSP circuits using extrapolated checksums with minimal test points
Author :
Chakrabarti, Sudip ; Chatterjee, Abhijit
Author_Institution :
Sch. of Electr. & Comput. Eng., Georgia Inst. of Technol., Atlanta, GA, USA
fYear :
1999
fDate :
1999
Firstpage :
955
Lastpage :
963
Abstract :
In this paper, we propose a novel concurrent error detection scheme for linear digital variable systems that significantly reduces the hardware overhead of the detection circuitry. A new theory of extrapolated checksums has been developed. A novel test point selection algorithm has been proposed to select the minimal set of test points without compromising fault coverage. Techniques for selecting code vectors (to compute checksums) and designing error detection circuitry have been discussed. Experimental results indicate significant hardware reduction in the error detection circuitry
Keywords :
data flow graphs; digital filters; digital signal processing chips; error detection codes; fault simulation; fault tolerant computing; integrated circuit testing; DSP circuits; code vectors selection; concurrent error detection scheme; data flow graphs; elliptic filter circuit; error detection circuitry; error latency; extrapolated checksums; fault coverage; fault models; fault tolerant systems; gain matrix; linear digital variable systems; minimal test points; on-line fault detection; reduced hardware overhead; test point selection algorithm; Circuit faults; Circuit testing; Digital signal processing; Electrical fault detection; Fault detection; Fault tolerance; Fault tolerant systems; Hardware; Signal processing algorithms; Space technology;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Test Conference, 1999. Proceedings. International
Conference_Location :
Atlantic City, NJ
ISSN :
1089-3539
Print_ISBN :
0-7803-5753-1
Type :
conf
DOI :
10.1109/TEST.1999.805828
Filename :
805828
Link To Document :
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