DocumentCode :
3331389
Title :
Monitoring of metalized film capacitors degradation with impedance nonlinearity measurement
Author :
Placek, Martin ; Mach, P.
Author_Institution :
Dept. of Electrotechnol., Czech Tech. Univ. in Prague, Prague, Czech Republic
fYear :
2013
fDate :
24-27 Oct. 2013
Firstpage :
263
Lastpage :
266
Abstract :
Self-healing capacitors fabricated of metalized polypropylene film as the dielectric material are widely used in power electronics. Self-healing process makes elimination of local defects in these capacitors possible and extends the life-time of them. It was shown that the measuring of capacitor V/A characteristic nonlinearity is usable and effective tool for monitoring of capacitor quality. Six capacitors of this type were aged in an oven at the temperature of 90 °C for 1000 hours under normal ambient conditions and changes caused by ageing were monitored with the nonlinearity measurement. It was found that nonlinearity of capacitor grows with the time of ageing.
Keywords :
ageing; dielectric thin films; electric impedance measurement; thin film capacitors; ageing; capacitor V-A characteristic nonlinearity; capacitor degradation; capacitor quality; dielectric material; impedance nonlinearity measurement; local defects; metalized polypropylene film; power electronics; self-healing capacitors; self-healing process; Aging; Capacitors; Current measurement; Electrodes; Polymer films; Temperature measurement; Capacitor of metallized film; nonlinearity measurement; nonlinearity of I/V characteristic; self-healing capacitor;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design and Technology in Electronic Packaging (SIITME), 2013 IEEE 19th International Symposium for
Conference_Location :
Galati
Type :
conf
DOI :
10.1109/SIITME.2013.6743687
Filename :
6743687
Link To Document :
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