Title :
High time for high level ATPG
Author_Institution :
Mentor Graphics Corporation
Keywords :
Abstracts; Automatic test pattern generation; Circuit faults; Circuit testing; Computational complexity; Foundries; Graphics; Integrated circuit testing; Manufacturing; Semiconductor device testing;
Conference_Titel :
Test Conference, 1999. Proceedings. International
Print_ISBN :
0-7803-5753-1
DOI :
10.1109/TEST.1999.805848
