DocumentCode :
3331729
Title :
ITC´99 Benchmark Circuits - Preliminary Results
Author :
Davidson, Scott
Author_Institution :
Sun Microsystems Inc.
fYear :
1999
fDate :
1999
Firstpage :
1125
Lastpage :
1125
Keywords :
Application specific integrated circuits; Automatic test pattern generation; Benchmark testing; Clocks; Explosions; Microprocessors; Modems; Software testing; Sun; System testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Test Conference, 1999. Proceedings. International
ISSN :
1089-3539
Print_ISBN :
0-7803-5753-1
Type :
conf
DOI :
10.1109/TEST.1999.805857
Filename :
805857
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=3331729
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