Title :
Application of Tools Developed at the University of Iowa to ITC-99 Benchmarks
Author :
Reddy, Sudhakar M.
Author_Institution :
University of Iowa
Keywords :
Circuit faults; Circuit testing; Compaction; Design automation; Logic testing; Sequential analysis; Sequential circuits; System testing; Test pattern generators; Very large scale integration;
Conference_Titel :
Test Conference, 1999. Proceedings. International
Print_ISBN :
0-7803-5753-1
DOI :
10.1109/TEST.1999.805860
