Title :
It Makes Sense to Combine DFT and DFR/DFY
Author :
Aitken, Robert C.
Author_Institution :
Hewlett-Packard Co.
Keywords :
CMOS technology; Circuit testing; Costs; Design for testability; Electrostatic discharge; Integrated circuit testing; Manufacturing processes; Process design; Stress; Voltage;
Conference_Titel :
Test Conference, 1999. Proceedings. International
Print_ISBN :
0-7803-5753-1
DOI :
10.1109/TEST.1999.805874
