DocumentCode
3332041
Title
Design for Yield and Reliability is MORE Important Than DFT
Author
Walker, D.M.H.
Author_Institution
Texas A&M University
fYear
1999
fDate
1999
Firstpage
1146
Lastpage
1146
Keywords
Automatic test pattern generation; Computer science; Costs; Design engineering; Design for testability; Disaster management; Life estimation; Microprocessors; Stress; Testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 1999. Proceedings. International
ISSN
1089-3539
Print_ISBN
0-7803-5753-1
Type
conf
DOI
10.1109/TEST.1999.805877
Filename
805877
Link To Document