DocumentCode :
3332518
Title :
K-way partitioning under timing, pin, and area constraints
Author :
Tumbush, Gregory ; Bhatia, Dinesh
Author_Institution :
Dept. of Electr. & Comput. Eng., Cincinnati Univ., OH, USA
fYear :
1997
fDate :
8-10 Oct 1997
Firstpage :
95
Lastpage :
106
Abstract :
Circuit partitioning is a very extensively studied problem. Our proposed methodology easily extends to multiple constraints that are very dominant in the design of large scale VLSI systems. In this paper we formulate the problem as a nonlinear program (NLP). The NLP is solved for the objective of minimum cutset size under the constraints of pins, area, and timing. We have tested the unified framework for area, timing, and pin constraints. The NLP is solved using the commercial LP/NLP solver MINOS. We have done extensive testing using large scale RT level benchmarks and have shown that our methods can be used for exploring the design space for obtaining constraint satisfying system designs. We also provide extensions for solving system design problems where a choice between multiple technologies, packaging components, performance, cost, yield, and more can be the constraints for design related decisions
Keywords :
VLSI; cellular arrays; circuit CAD; high level synthesis; integrated circuit design; integrated circuit packaging; integrated circuit yield; linear programming; nonlinear programming; timing; K-way partitioning; LP/NLP solver; MINOS; area constraints; circuit partitioning; design space; large scale RT level benchmarks; large scale VLSI systems; minimum cutset size; multiple constraints; nonlinear program; packaging components; pin constraints; timing; yield; Benchmark testing; Circuits; Large-scale systems; Packaging; Pins; Space exploration; Space technology; System testing; Timing; Very large scale integration;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Innovative Systems in Silicon, 1997. Proceedings., Second Annual IEEE International Conference on
Conference_Location :
Austin, TX
ISSN :
1094-7116
Print_ISBN :
0-7803-4276-3
Type :
conf
DOI :
10.1109/ICISS.1997.630250
Filename :
630250
Link To Document :
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