DocumentCode :
3332568
Title :
Chaos evolution of short-gap discharge under dielectric-covered electrodes
Author :
Zheng Dian-chun ; Zhang Zhong-lin ; Zhu Shi-hua ; Zhai Xiu-quan ; Zhao Da-wei
Author_Institution :
Coll. of Electr. & Electron. Eng., Harbin Univ. of Sci. & Technol., Harbin, China
Volume :
2
fYear :
2011
fDate :
22-24 Aug. 2011
Firstpage :
1305
Lastpage :
1309
Abstract :
In this paper, the short gap discharge of electrode coverage was simulated numerically. The one dimensional and self-consistent fluid model of gas discharge was established which is composed by the electron and ion continuity and momentum transfer equations, and the nonlinear equations were solved by using the SG algorithm. The results showed that the short gap discharge of electrode coverage behaves the typical nonlinear characteristic such as Hopf bifurcation and Chaos. Two ways leading to Chaos have been found by changing discharge conditions, one is quasi-period and the other is double-period. Seemingly random discharge may reveal the hidden simple laws, through studying nonlinear phenomena of the short gap discharge of electrode coverage, especially the phenomena of Chaos to find out the common law, which is generally followed by complex issues.
Keywords :
bifurcation; chaos; discharges (electric); electrodes; nonlinear differential equations; numerical analysis; random processes; Hopf bifurcation; SG algorithm; dielectric-covered electrode; gas discharge model; ion continuity; momentum transfer equation; nonlinear equation; one dimensional fluid model; self-consistent fluid model; short-gap discharge chaos evolution; Chaos; Degradation; Insulation life; Chaos; Hopf bifurcation; Lyapunov index; electrode coverage; nonlinear; short gap discharge;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Strategic Technology (IFOST), 2011 6th International Forum on
Conference_Location :
Harbin, Heilongjiang
Print_ISBN :
978-1-4577-0398-0
Type :
conf
DOI :
10.1109/IFOST.2011.6021258
Filename :
6021258
Link To Document :
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