DocumentCode :
3332619
Title :
Worst-case prediction using the Arrhenius model
Author :
Yu, Yangyang ; Chen, Felix
Author_Institution :
Powerwave Technol. Inc., Santa Ana, CA
fYear :
2009
fDate :
26-29 Jan. 2009
Firstpage :
69
Lastpage :
71
Abstract :
We present in this paper an Arrhenius-based method of assessing MTTF as applied to one of our own products. This undertaking was motivated by a sudden mechanical change to a product nearing shipment that raised its internal operating temperature 10degC. As the time available precluded any retesting, we undertook this analysis in lieu of a full requalification to show that MTTF would not be compromised by the chassis swap. Recommendations are also given on improving the current analysis.
Keywords :
prediction theory; reliability; Arrhenius model; temperature 10 degC; worst-case prediction; Acceleration; Equations; Failure analysis; Predictive models; Printed circuits; Protection; Semiconductor devices; Temperature distribution; Arrhenius model; MTTF; acceleration factor;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Reliability and Maintainability Symposium, 2009. RAMS 2009. Annual
Conference_Location :
Fort Worth, TX
ISSN :
0149-144X
Print_ISBN :
978-1-4244-2508-2
Electronic_ISBN :
0149-144X
Type :
conf
DOI :
10.1109/RAMS.2009.4914652
Filename :
4914652
Link To Document :
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