Title :
Behavioral-Level Test Development
Author :
Johnson, William A.
Author_Institution :
Texas Instruments Incorporated, Dallas, TX
Abstract :
An argument is made that the economics of test development in the LSI-VLSI era require creation and use of test development software aids that operate from high-level behavioral circuit models. Behavioral models are defined to be abstract specifications of the circuit function. Problems with the use of current-day gate-level software aids are discussed. Suggestions are given for implementing behavioral-level test generation tools. Recent work in this area at Texas Instruments Incorporated (TI) is discussed.
Keywords :
Automatic logic units; Circuit faults; Circuit testing; Costs; Environmental economics; Instruments; Integrated circuit modeling; Logic circuits; Logic testing; Software testing;
Conference_Titel :
Design Automation, 1979. 16th Conference on
DOI :
10.1109/DAC.1979.1600105
