DocumentCode :
3333142
Title :
Development of two-dimensional micro-pixel gas chamber capable of individual line readout for neutron measurement
Author :
Toh, K. ; Yamagishi, H. ; Sakasai, K. ; Nakamura, T. ; Soyama, K.
Author_Institution :
J-PARC center, Japan Atomic Energy Agency, Tokai, Japan
fYear :
2009
fDate :
Oct. 24 2009-Nov. 1 2009
Firstpage :
678
Lastpage :
681
Abstract :
An improved micro-pixel detector element that showed high voltage tolerance was fabricated, and irradiation experiments using a Cf-252 neutron source were conducted on it. A gas-based neutron detection system capable of individual line readout, consisting of the developed detector element, gas chamber, amplifier-shaper-discriminator boards, optical signal transmission device, and a fast data acquisition device, was constructed for the experiment. The neutron detection system can identify signal-pulse peaks of neutrons and easily distinguish the neutron signals from background noises. The measured gas gain was approximately 280 at the supplied anode-cathode voltage of 670 V and total pressure of 0.5 MPa (0.45 MPa of 3He and 0.05 MPa of CF4). The gas gain did not decrease when the detection system was operated for 150 h. The average gain spread in two-dimensional imaging was 6.2%.
Keywords :
amplifiers; data acquisition; discriminators; neutron detection; neutron effects; nuclear electronics; position sensitive particle detectors; readout electronics; 2D micropixel gas chamber; Cf-252 neutron source; amplifier-shaper-discriminator boards; fast data acquisition device; gas gain; gas-based neutron detection system; individual line readout; micropixel detector element; neutron measurement; optical signal transmission device; pressure 0.5 MPa; time 150 h; voltage 670 V; voltage tolerance; Background noise; Data acquisition; Detectors; Neutrons; Optical amplifiers; Optical devices; Semiconductor optical amplifiers; Signal processing; Stimulated emission; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nuclear Science Symposium Conference Record (NSS/MIC), 2009 IEEE
Conference_Location :
Orlando, FL
ISSN :
1095-7863
Print_ISBN :
978-1-4244-3961-4
Electronic_ISBN :
1095-7863
Type :
conf
DOI :
10.1109/NSSMIC.2009.5402029
Filename :
5402029
Link To Document :
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