DocumentCode
3333230
Title
Resonance characteristics and polarization profile of partially poled P(VDF-TrFE) copolymer
Author
Ploss, Bernd ; Chan, H.L.W. ; Kwok, K.W. ; Choy, C.L.
Author_Institution
Inst. fur Angewandte Phys., Karlsruhe Univ., Germany
fYear
1996
fDate
25-30 Sep 1996
Firstpage
279
Lastpage
284
Abstract
Thick films of polyvinylidene fluoride/trifluoroethylene (P(VDF-TrFE)) copolymer with the composition 80/20 mol-% were poled at elevated temperature. The dielectric spectrum of this film shows two resonance peaks which correspond to the fundamental and second harmonic of the thickness vibration mode. Even harmonics of the thickness mode are usually not observed as they are not coupled to the electrical excitation. Piezoelectric and pyroelectric profiling experiments using both the pressure wave propagation (PWP) method and the laser intensity modulation method (LIMM) show that the copolymer has an inhomogeneous polarization profile which leads to the observed second order harmonic. In particular, these methods indicate that an unpoled region exists near the cathode side of the sample. By fitting the observed dielectric spectrum to a model of two Lorentz oscillators, the oscillation strengths have been estimated and found to he consistent with those obtained from the appropriate Fourier coefficients of the measured pyroelectric profile
Keywords
dielectric polarisation; dielectric resonance; piezoelectric materials; polymer blends; polymer films; pyroelectricity; vibrations; Fourier coefficient; Lorentz oscillator; dielectric spectrum; electrical excitation; laser intensity modulation method; partially poled P(VDF-TrFE) copolymer; piezoelectric profile; polarization profile; pressure wave propagation; pyroelectric profile; resonance; second harmonic; thick film; thickness vibration mode; Couplings; Dielectrics; Laser excitation; Optical propagation; Piezoelectric films; Polarization; Pyroelectricity; Resonance; Temperature; Thick films;
fLanguage
English
Publisher
ieee
Conference_Titel
Electrets, 1996. (ISE 9), 9th International Symposium on
Conference_Location
Shanghai
Print_ISBN
0-7803-2695-4
Type
conf
DOI
10.1109/ISE.1996.578084
Filename
578084
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