A scalar cost function for analyzing the quality of totally self-checking design methodologies

Author

Bolchini, C. ; Salice, F. ; Sciuto, D.

Author_Institution

Dipt. di Elettronica e Inf., Politecnico di Milano, Italy

fYear

1997

fDate

8-10 Oct 1997

Firstpage

196

Abstract

This paper proposes a scalar cost function for analyzing the quality of Totally Self-Checking combinational devices; in particular the presented evaluator allows one to take into account other significant aspects affecting a TSC implementation rather than area overhead. The cost function is based on a measure which dynamically defines the probability to achieve the TSC goal at cycle t with respect to fault occurrence and circuit stimulation. As some experimental results highlight, the smallest circuits aren´t always the most desirable one

Keywords

automatic testing; combinational circuits; integrated circuit testing; integrated logic circuits; logic design; logic testing; probability; TSC design methodologies; circuit stimulation; combinational devices; cost function; fault occurrence; probability; scalar cost function; totally self-checking design; Circuit faults; Clocks; Combinational circuits; Cost function; Design methodology; Electrical fault detection; Fault detection; Performance evaluation; Speech analysis; Time measurement;

fLanguage

English

Publisher

ieee

Conference_Titel

Innovative Systems in Silicon, 1997. Proceedings., Second Annual IEEE International Conference on

Conference_Location

Austin, TX

ISSN

1094-7116

Print_ISBN

0-7803-4276-3

Type

conf

DOI

10.1109/ICISS.1997.630260

Filename

630260