Fast kVp-switching dual energy CT for PET attenuation correction

Author

Huh, Wonseok ; Fessler, Jeffrey A. ; Alessio, Adam M. ; Kinahan, Paul E.

Author_Institution

Dept. of Electr. Eng. & Comput. Sci., Univ. of Michigan, Ann Arbor, MI, USA

fYear

2009

fDate

Oct. 24 2009-Nov. 1 2009

Firstpage

2510

Lastpage

2515

Abstract

X-ray CT images are used routinely for attenuation correction in PET/CT systems. However, conventional CT-based attenuation correction (CTAC) can be inaccurate in regions containing iodine contrast agent. Dual-energy (DE) CT has the potential to improve the accuracy of attenuation correction in PET, but conventional DECT can suffer from motion artifacts. Recent X-ray CT systems can collect DE sinograms by rapidly switching the X-ray tube voltage between two levels for alternate projection views, reducing motion artifacts. The goal of this work is to study statistical methods for image reconstruction from both fast kVp-switching DE scans and from conventional dual-rotate DE scans in the context of CTAC for PET.

Keywords

computerised tomography; image reconstruction; medical image processing; motion compensation; positron emission tomography; CT based attenuation correction; CTAC; DECT; PET attenuation correction; PET-CT systems; X-ray CT images; X-ray tube voltage; computerised tomography; dual energy CT; dual energy sinograms; dual rotate DE scans; fast source voltage switching CT; image reconstruction; iodine contrast agent; motion artifacts; positron emission tomography; Attenuation; Biological materials; Computed tomography; Image reconstruction; Nuclear and plasma sciences; Optical imaging; Positron emission tomography; Statistical analysis; Voltage; X-ray imaging; attenuation correction factors; dual-energy X-ray computed tomography; model-based image reconstruction; penalized weighted least squares method;

fLanguage

English

Publisher

ieee

Conference_Titel

Nuclear Science Symposium Conference Record (NSS/MIC), 2009 IEEE

Conference_Location

Orlando, FL

ISSN

1095-7863

Print_ISBN

978-1-4244-3961-4

Electronic_ISBN

1095-7863

Type

conf

DOI

10.1109/NSSMIC.2009.5402036

Filename

5402036