• DocumentCode
    3333501
  • Title

    Real-time embedded skew detection and frame removal

  • Author

    Banerjee, S. ; Noushath, S. ; Parikh, P. ; Ramachandrula, S. ; Kuchibhotla, A. ; Sharma, A.

  • Author_Institution
    HP Labs., Bangalore, India
  • fYear
    2010
  • fDate
    26-29 Sept. 2010
  • Firstpage
    2181
  • Lastpage
    2184
  • Abstract
    It is common to observe document skew and frame artifacts while photocopying and scanning documents. The motivation of this work is to embed skew correction and frame removal in the copy pipeline of a device to achieve `one touch´ cleanup. The two challenges that this poses are the need for: (a) substantially reducing computation and memory requirements and (b) minimizing the false positives. Peripheral document features, such as, page/content edges are low-complexity document skew predictors, and content-based approaches are of relatively higher complexity skew predictors. But state-of-the-art page edge detection methods fail on low-contrast document images, or for similar scanbed/document background. To minimize false positives required in embedded implementations, we propose: (1) a robust page edge detection algorithm that is a multiplicative combination of gradients and line based page edge detectors, (2) a robust skew detection algorithm that is a linear combination of page/content edge and content based predictors, and (3) a pipeline for skew correction and frame removal that uses these algorithms and has near-100% accuracy over a wide range of document images.
  • Keywords
    document image processing; edge detection; photocopying; document images; frame artifacts; frame removal; page edge detection; peripheral document features; photocopying; real-time embedded skew detection; scanning documents; Accuracy; Complexity theory; Image edge detection; Linearity; Noise; Pipelines; Robustness; embedded frame removal; page edge detection; real-time embedded skew detection;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Image Processing (ICIP), 2010 17th IEEE International Conference on
  • Conference_Location
    Hong Kong
  • ISSN
    1522-4880
  • Print_ISBN
    978-1-4244-7992-4
  • Electronic_ISBN
    1522-4880
  • Type

    conf

  • DOI
    10.1109/ICIP.2010.5651454
  • Filename
    5651454