• DocumentCode
    3333869
  • Title

    A de-embedding method to improve RFICs testing errors due to radiated electromagnetic interference

  • Author

    Cheng-Nan Hu

  • Author_Institution
    Commun. Res. Center, Oriental Inst. of Technol., Taipei, Taiwan
  • fYear
    2011
  • fDate
    8-10 Aug. 2011
  • Firstpage
    176
  • Lastpage
    179
  • Abstract
    When conducting a RFIC performance testing, a sensor for measuring ambient EM signals was used to determine whether interference was the cause of the reported testing error. Upon detecting a testing error, a de-embedding procedure was actuated to recover the testing error and to improve yield-loss. For theoretical validation, Monte-Carlo procedure was applied in a “Source-Path-Victim” model to simulate the effect of electromagnetic interference (EMI) on RFIC measurement.
  • Keywords
    electromagnetic interference; integrated circuit testing; radiofrequency integrated circuits; sensors; EM signals; Monte-Carlo procedure; RFIC measurement; RFIC performance testing; RFIC testing errors; de-embedding method; radiated electromagnetic interference; sensor; source-path-victim model; Bit error rate; Degradation; Electromagnetic interference; Radiofrequency integrated circuits; Receivers;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electromagnetics, Applications and Student Innovation (iWEM), 2011 IEEE International Workshop on
  • Conference_Location
    Taipei
  • Print_ISBN
    978-1-61284-462-6
  • Electronic_ISBN
    978-1-61284-461-9
  • Type

    conf

  • DOI
    10.1109/iWEM.2011.6021476
  • Filename
    6021476