DocumentCode
3333869
Title
A de-embedding method to improve RFICs testing errors due to radiated electromagnetic interference
Author
Cheng-Nan Hu
Author_Institution
Commun. Res. Center, Oriental Inst. of Technol., Taipei, Taiwan
fYear
2011
fDate
8-10 Aug. 2011
Firstpage
176
Lastpage
179
Abstract
When conducting a RFIC performance testing, a sensor for measuring ambient EM signals was used to determine whether interference was the cause of the reported testing error. Upon detecting a testing error, a de-embedding procedure was actuated to recover the testing error and to improve yield-loss. For theoretical validation, Monte-Carlo procedure was applied in a “Source-Path-Victim” model to simulate the effect of electromagnetic interference (EMI) on RFIC measurement.
Keywords
electromagnetic interference; integrated circuit testing; radiofrequency integrated circuits; sensors; EM signals; Monte-Carlo procedure; RFIC measurement; RFIC performance testing; RFIC testing errors; de-embedding method; radiated electromagnetic interference; sensor; source-path-victim model; Bit error rate; Degradation; Electromagnetic interference; Radiofrequency integrated circuits; Receivers;
fLanguage
English
Publisher
ieee
Conference_Titel
Electromagnetics, Applications and Student Innovation (iWEM), 2011 IEEE International Workshop on
Conference_Location
Taipei
Print_ISBN
978-1-61284-462-6
Electronic_ISBN
978-1-61284-461-9
Type
conf
DOI
10.1109/iWEM.2011.6021476
Filename
6021476
Link To Document