• DocumentCode
    3334290
  • Title

    Compendia of Radiation Test Results of Integrated Circuits

  • Author

    Layton, Phil ; Gilbert, Charlie ; Patnaude, Ed ; Williamson, Gale ; Longden, Larry ; Sloan, Clancy

  • Author_Institution
    Maxwell Technol., San Diego, CA
  • fYear
    2006
  • fDate
    38899
  • Firstpage
    13
  • Lastpage
    18
  • Abstract
    TID and SEE data was taken to qualify and evaluate IC devices for radiation susceptibility in the natural space environment. A summary of the test data is presented and discussed
  • Keywords
    dosimetry; integrated circuit testing; radiation hardening (electronics); integrated circuits; radiation susceptibility; radiation test data; single event effects; total ionizing dose; Circuit testing; Gold; Integrated circuit testing; Performance analysis; Performance evaluation; Pulse width modulation; Single event upset; Space technology; Space vector pulse width modulation; Voltage; Radiation; Test Data;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Radiation Effects Data Workshop, 2006 IEEE
  • Conference_Location
    Ponte Vedra, FL
  • Print_ISBN
    1-4244-0638-2
  • Type

    conf

  • DOI
    10.1109/REDW.2006.295462
  • Filename
    4077276
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3334290