Title :
Comparative study on the effects of PVT variations between a novel all-MOS current reference and alternative CMOS solutions
Author :
Windels, Jindrich ; Van Praet, C. ; De Pauw, Herbert ; Doutreloigne, Jan
Author_Institution :
CMST, Ghent Univ., Ghent, Belgium
Abstract :
Sensitivity to supply voltage, temperature and process variations of a number of current reference topologies and a novel circuit is compared in ON Semi I3T80 technology. The novel current reference shows the lowest process dependency, while supply and temperature dependency remain acceptably low.
Keywords :
CMOS integrated circuits; ON Semi I3T80 technology; PVT variations; all-MOS current reference; alternative CMOS solutions; CMOS technology; Circuit optimization; Circuit simulation; Circuit topology; Integrated circuit technology; Silicon; Space technology; Temperature dependence; Temperature sensors; Threshold voltage;
Conference_Titel :
Circuits and Systems, 2009. MWSCAS '09. 52nd IEEE International Midwest Symposium on
Conference_Location :
Cancun
Print_ISBN :
978-1-4244-4479-3
Electronic_ISBN :
1548-3746
DOI :
10.1109/MWSCAS.2009.5236154
